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MICRO
2007
IEEE
79views Hardware» more  MICRO 2007»
14 years 2 months ago
Self-calibrating Online Wearout Detection
Technology scaling, characterized by decreasing feature size, thinning gate oxide, and non-ideal voltage scaling, will become a major hindrance to microprocessor reliability in fu...
Jason A. Blome, Shuguang Feng, Shantanu Gupta, Sco...
DAC
2001
ACM
14 years 8 months ago
A True Single-Phase 8-bit Adiabatic Multiplier
This paper presents the design and evaluation of an 8-bit adiabatic multiplier. Both the multiplier core and its built-in self-test logic have been designed using a true single-ph...
Suhwan Kim, Conrad H. Ziesler, Marios C. Papaefthy...
DAC
2002
ACM
14 years 8 months ago
Embedded software-based self-testing for SoC design
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li...
CF
2010
ACM
14 years 29 days ago
Proposition for a sequential accelerator in future general-purpose manycore processors and the problem of migration-induced cach
As the number of transistors on a chip doubles with every technology generation, the number of on-chip cores also increases rapidly, making possible in a foreseeable future to des...
Pierre Michaud, Yiannakis Sazeides, André S...
BMCBI
2010
95views more  BMCBI 2010»
13 years 8 months ago
An effective approach for identification of in vivo protein-DNA binding sites from paired-end ChIP-Seq data
Background: ChIP-Seq, which combines chromatin immunoprecipitation (ChIP) with high-throughput massively parallel sequencing, is increasingly being used for identification of prot...
Congmao Wang, Jie Xu, Dasheng Zhang, Zoe A. Wilson...