1327 search results - page 35 / 266 » Citing for high impact |
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
HICSS
2012
IEEE
12 years 5 months ago
2012
IEEE
Security vulnerabilities continue to be an issue in the software field and new severe vulnerabilities are discovered in software products each month. This paper analyzes estimates...
ISQED
2010
IEEE
14 years 4 months ago
2010
IEEE
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
ISQED
2006
IEEE
14 years 3 months ago
2006
IEEE
It is well known that fill insertion adversely affects total and coupling capacitance of interconnects. While grounded fill can be extracted by full-chip extractors, floating ...
VEE
2006
ACM
14 years 3 months ago
2006
ACM
During recent years, microprocessor energy consumption has been surging and efforts to reduce power and energy have received a lot of attention. At the same time, virtual executio...