550 search results - page 6 / 110 » Complementarity of Error Detection Techniques |
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
In deep sub-micron ICs, growing amounts of ondie memory and scaling effects make embedded memories increasingly vulnerable to reliability and yield problems. As scaling progresses...
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
This paper presents a new technique for on-line consistency checking of embedded DRAMs. The basic idea is to use the periodic refresh operation for concurrently computing a test c...
DATE
2003
IEEE
14 years 27 days ago
2003
IEEE
In this paper is described a software technique allowing to detect soft errors occurring in processor-based digital architectures. The detection mechanism is based on a set of rul...
DATE
2000
IEEE
14 years 11 hour ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
DSD
2006
IEEE
13 years 9 months ago
2006
IEEE
The paper deals with synthesis technique for designing circuits with cascade errors detection. The proposed technique is based on partitioning a scheme into a number of cascades f...