Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65nm and below. Voltage waveform shapes are increasingly more difficult to repr...
In this paper, we explore the concept of using analytical models to efficiently generate delay change curves (DCCs) that can then be used to characterize the impact of noise on an...
Kanak Agarwal, Yu Cao, Takashi Sato, Dennis Sylves...
—IR drop noise has become a critical issue in advanced process technologies. Traditionally, timing analysis in which the IR drop noise is considered assumes a worst-case IR drop ...
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
Matthew R. Guthaus, Natesan Venkateswaran, Chandu ...
: The performance of feasibility tests is crucial in many applications. When using feasibility tests online only a limited amount of analysis time is available. Run-time efficiency...