4299 search results - page 56 / 860 » Concurrent Test Generation |
135
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KBSE
1998
IEEE
15 years 6 months ago
1998
IEEE
We report on GADGET, a new software test generation system that uses combinatorial optimization to obtain condition/decision coverage of C/C++ programs. The GADGET system is fully...
110
Voted
ITC
1991
IEEE
15 years 6 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...
117
Voted
VLSID
2009
IEEE
16 years 3 months ago
2009
IEEE
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
119
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ICSEA
2007
IEEE
15 years 8 months ago
2007
IEEE
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
112
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VTS
1998
IEEE
15 years 6 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...