15 search results - page 1 / 3 » Configuring multiple scan chains for minimum test time |
ICCAD
1992
IEEE
13 years 11 months ago
1992
IEEE
VTS
2003
IEEE
14 years 28 days ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
ITC
2003
IEEE
14 years 29 days ago
2003
IEEE
ICCAD
2007
IEEE
14 years 4 months ago
2007
IEEE
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...