In a scan-based system with a large number of flip-flops, a major component of power is consumed during scanshift and clocking operation in test mode. In this paper, a novel scan-...
Bhargab B. Bhattacharya, Sharad C. Seth, Sheng Zha...
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
It has been proven that scan path is a potent hazard for secure chips. Scan based attacks have been recently demonstrated against DES or AES and several solutions have been presen...
—Conventional scan design imposes considerable area and delay overheads. To establish a scan chain in the test mode, multiplexers at the inputs of flip-flops and scan wires are...