BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...