109 search results - page 10 / 22 » Design Methodology and Manufacture of a Microinductor |
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
SLIP
2006
ACM
14 years 1 months ago
2006
ACM
Manufacturable design requires matching of interconnects which have equal nominal dimensions. New design rules are projected to bring guarantee rules for interconnect matching. In...
DAC
2001
ACM
14 years 8 months ago
2001
ACM
Crosstalk effects degrade the integrity of signals traveling on long interconnects and must be addressed during manufacturing testing. External testing for crosstalk is expensive ...
ICCAD
2003
IEEE
14 years 21 days ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
Escaped errors in released silicon are growing in number due to the increasing complexity of modern processor designs and shrinking production schedules. Worsening the problem are ...