124 search results - page 4 / 25 » Designing Reliable Digital Molecular Electronic Circuits |
ASPDAC
2009
ACM
14 years 1 months ago
2009
ACM
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
GECCO
2004
Springer
14 years 23 days ago
2004
Springer
This article summarizes two experiments utilizing building blocks to find analog electronic circuits on a CMOS Field Programmable Transistor Array (FPTA). The FPTA features 256 pr...
ISQED
2005
IEEE
14 years 29 days ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
DAC
2011
ACM
12 years 7 months ago
2011
ACM
Just as electronic systems implement computation in terms of voltage (energy per unit charge), molecular systems compute in terms of chemical concentrations (molecules per unit vo...