30 search results - page 4 / 6 » Diagnosis of Hold Time Defects |
ETS
2011
IEEE
12 years 7 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
∗ Diagnosis is becoming a major concern with the rapid development of semiconductor memories. It provides information about the location of manufacturing defects in the memory, a...
DDECS
2007
IEEE
14 years 2 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
ETS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...