19 search results - page 1 / 4 » Diagnosis of Realistic Defects Based on the X-Fault Model |
DDECS
2008
IEEE
14 years 20 days ago
2008
IEEE
Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling te...
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
Abstract — This paper defines a new diagnosis problem for diagnosing delay defects based upon statistical timing models. We illustrate the differences between the delay defect d...
VTS
2003
IEEE
14 years 4 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
ITC
1998
IEEE
14 years 3 months ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ASPDAC
2001
ACM
14 years 2 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...