Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
We study integrality gaps for SDP relaxations of constraint satisfaction problems, in the hierarchy of SDPs defined by Lasserre. Schoenebeck [25] recently showed the first integra...
— Although the LUT (look-up table) size of FPGAs has been optimized for general applications, complicated designs may contain a large number of cascaded LUTs between flip-flops...
Microencapsulated electrophoretic displays (EPDs) are quickly emerging as an important technology for use in battery-powered portable computing devices. Thanks to bistability and ...
Michael A. Baker, Aviral Shrivastava, Karam S. Cha...
In the nanometer VLSI technology, the variation effects like manufacturing variation, power supply noise, temperature etc. become very significant. As one of the most vital nets...