257 search results - page 39 / 52 » Electronic circuit reliability modeling |
TVLSI
2010
13 years 4 months ago
2010
Clock network is a vulnerable victim of variations as well as a main power consumer in many integrated circuits. Recently, link-based non-tree clock network attracts people's...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
In this paper we present an overview of an on-chip noise detection circuit. Mainly, this work is different form the previous works concerning on-chip noise measurement in one or m...
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
MICRO
2008
IEEE
14 years 4 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
ESAW
2007
Springer
14 years 4 months ago
2007
Springer
In the field of multiagent systems (MAS), the computational models of trust and reputation have attracted increasing interest since electronic and open environments became a reali...