This paper presents a systematic design methodology for yield enhancement of asynchronous logic circuits using 3-D (3-Dimensional) integration technology. In this design, the targ...
Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido...
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
Niloy Ganguly, Biplab K. Sikdar, Parimal Pal Chaud...
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...