We tackle the problem of fault-free assumptions in current PLB and interconnect built-in-self-test (BIST) techniques for FPGAs. These assumptions were made in order to develop stro...
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...