259 search results - page 31 / 52 » Fault Tolerance for Manufacturing Components |
ISCA
2010
IEEE
14 years 2 months ago
2010
IEEE
Aggressive technology scaling into the nanometer regime has led to a host of reliability challenges in the last several years. Unlike onchip caches, which can be efficiently prot...
VTS
2007
IEEE
14 years 4 months ago
2007
IEEE
—As the complexity of the integrated circuits increases, they become more susceptible to manufacturing faults, decreasing the total process yield. Thus, it would be desirable to ...
ICCAD
2002
IEEE
14 years 6 months ago
2002
IEEE
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
HPDC
2000
IEEE
14 years 2 months ago
2000
IEEE
In this paper we present a robust software infrastructure for metacomputing. The system is intended to be used by others as a building block for large and powerful computational g...
ICCAD
2000
IEEE
14 years 2 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...