372 search results - page 70 / 75 » Fault simulation on reconfigurable hardware |
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
— The use of dynamic voltage and frequency scaling (DVFS) in contemporary multicores provides significant protection from unpredictable thermal events. A side effect of DVFS can ...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
IWCMC
2006
ACM
14 years 1 months ago
2006
ACM
Wireless sensors use low power radio transceivers due to the stringent constraints on battery capacity. As a result, radio transmission with wireless sensors is unreliable. Furthe...
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
SASP
2009
IEEE
14 years 2 months ago
2009
IEEE
— As growing power dissipation and thermal effects disrupted the rising clock frequency trend and threatened to annul Moore’s law, the computing industry has switched its route...