56 search results - page 7 / 12 » FinFETs for nanoscale CMOS digital integrated circuits |
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
With aggressive gate oxide scaling, latent defects in the gate oxide manifest as traps that, in time, lead to gate oxide breakdown. Progressive gate oxide breakdown, also referred...
DAC
2006
ACM
14 years 1 months ago
2006
ACM
This panel discusses the following topics. With the ongoing trend towards more and more digitization in applications ranging from multimedia to telecommunications, there is a big ...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
This paper introduces a CAD framework for co-simulation of hybrid circuits containing CMOS and SET (Single Electron Transistor) devices. An improved analytical model for SET is al...
ICCAD
2000
IEEE
13 years 11 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Higher levels of integration have led to a generation of integrated circuits for which power dissipation and reliability are major design concerns. In CMOS circuits, both of these ...