Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...
Peeter Ellervee, Jaan Raik, Valentin Tihhomirov, K...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
This paper presents a fault tolerant design technique for the clockless wave pipeline. The specific architectural model investigated in this paper is the two-phase clockless asyn...
T. Feng, Byoungjae Jin, J. Wang, Nohpill Park, Yon...
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, Will...
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...