We present a selective encoding method that reduces test data volume and test application time for scan testing of Intellectual Property (IP) cores. This method encodes the slices ...
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
Conventional scan design imposes considerable area and delay overhead by using larger scan
ip-
ops and additional scan wires without utilizing the functionality of the combinatio...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Mike Ti...
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuc...
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...