192 search results - page 11 / 39 » Functional Scan Chain Testing |
ITC
1992
IEEE
14 years 1 months ago
1992
IEEE
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
DATE
2000
IEEE
14 years 1 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
ICCAD
2008
IEEE
14 years 6 months ago
2008
IEEE
—Increasing power densities due to process scaling, combined with high switching activity and poor cooling environments during testing, have the potential to result in high integ...
ASPDAC
2007
ACM
14 years 1 months ago
2007
ACM
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
DELTA
2004
IEEE
14 years 24 days ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...