138 search results - page 5 / 28 » Functional test generation for delay faults in combinational... |
DATE
2010
IEEE
14 years 23 days ago
2010
IEEE
When testing delay faults on critical paths, conventional structural test patterns may be applied in functionally-unreachable states, leading to over-testing or under-testing of t...
ICCAD
1991
IEEE
13 years 11 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
JISE
2000
13 years 7 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
ATS
2003
IEEE
14 years 29 days ago
2003
IEEE
A new technique for synthesizing totally symmetric Boolean functions is presented that achieves complete robust path delay fault testability. We apply BDDs for the synthesis of sy...
ATS
2003
IEEE
14 years 29 days ago
2003
IEEE
Software-based self-testing is a promising approach for the testing of processor cores which are embedded inside a System-on-a-Chip (SoC), as it can apply test vectors in function...