694 search results - page 36 / 139 » Gate Sizing Using a Statistical Delay Model |
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
ACE
2004
13 years 10 months ago
2004
Final year students in the Bachelor of Computing complete an industry project where they work in teams to build an IT system for an external client. Grading projects in these circ...
ISPD
2004
ACM
14 years 2 months ago
2004
ACM
As technology advances into nanometer territory, the antenna problem has caused significant impact on routing tools. The antenna effect is a phenomenon of plasmainduced gate oxide...
ICCAD
2003
IEEE
14 years 2 months ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...