38 search results - page 5 / 8 » Generation of Synthetic Sequential Benchmark Circuits |
SDM
2008
SIAM
13 years 9 months ago
2008
SIAM
Sequential pattern mining first proposed by Agrawal and Srikant has received intensive research due to its wide range applicability in many real-life domains. Various improvements...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
ISQED
2009
IEEE
14 years 2 months ago
2009
IEEE
Estimation of maximal power consumption is an essential task in VLSI circuit realizations since power value significantly affects the reliability of the circuits. The key issue o...
VTS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
EVOW
1999
Springer
13 years 11 months ago
1999
Springer
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...