251 search results - page 28 / 51 » Hierarchical Modeling and Simulation of Large Analog Circuit... |
GLVLSI
2010
IEEE
14 years 11 days ago
2010
IEEE
Graphene nanoribbon tunneling FETs (GNR TFETs) are promising devices for post-CMOS low-power applications because of the low subthreshold swing, high Ion/Ioff, and potential for l...
ITC
1998
IEEE
13 years 12 months ago
1998
IEEE
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
GCC
2004
Springer
14 years 1 months ago
2004
Springer
Trust establishment is hard in grid architecture by the ad hoc nature. To set up trust in large scale of network is more difficult. In this paper, we propose an automatic key manag...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
VLSID
2008
IEEE
14 years 8 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...