Abstract— With the increasing cost of global communication onchip, high-performance designs for data-intensive applications require architectures that distribute hardware resourc...
—As semiconductor manufacturing enters advanced nanometer design paradigm, aging and device wear-out related degradation is becoming a major concern. Negative Bias Temperature In...
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
This paper describes an on-chip programmable bias current generator, intended for mixed signal chips requiring a wide ranging set of currents. The individual generators share a ma...
This tutorial focuses on advanced techniques to cope with the complexity of designing modern digital chips which are complete systems often containing multiple processors, complex...