Abstract. We propose a syntax-driven test generation technique to auly derive abstract test cases from a set of requirements expressed in a linear temporal logic. Assuming that an ...
If access control policy decision points are not neatly separated from the business logic of a system, the evolution of a security policy likely leads to the necessity of changing...
Yves Le Traon, Tejeddine Mouelhi, Alexander Pretsc...
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
Mohammad Hosseinabady, Atefe Dalirsani, Zainalabed...
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
The design and architectures of a microcode-based memory BIST and programmable FSM-based memory BIST unit are presented. The proposed microcode-based memory BIST unit is more e ci...