52 search results - page 2 / 11 » Low Power BIST Based on Scan Partitioning |
DT
2002
13 years 7 months ago
2002
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
DFT
2003
IEEE
14 years 23 days ago
2003
IEEE
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
DFT
1999
IEEE
13 years 11 months ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...