89 search results - page 16 / 18 » Low Power Testing of VLSI Circuits: Problems and Solutions |
DAC
2009
ACM
14 years 2 months ago
2009
ACM
For a computing system to be trusted, it is equally important to verify that the system performs no more and no less functionalities than desired. Traditional testing and verifica...
SBCCI
2009
ACM
14 years 8 days ago
2009
ACM
Because of the aggressive scaling of integrated circuits and the given limits of atomic scales, circuit designers have to become more and more aware of the arising reliability and...
ISQED
2006
IEEE
14 years 1 months ago
2006
IEEE
As transistor counts keep increasing and clock frequencies rise, high power consumption is becoming one of the most important obstacles, preventing further scaling and performance...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Interconnect delay has become a critical factor in determining the performance of integrated circuits. Routing and buffering are powerful means of improving the circuit speed and ...
ISCAS
1999
IEEE
13 years 12 months ago
1999
IEEE
- A closed form expression for the propagation delay of a CMOS gate driving a distributed RLC line is introduced that is within 5% of dynamic circuit simulations for a wide range o...