89 search results - page 8 / 18 » Low Power Testing of VLSI Circuits: Problems and Solutions |
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
GLVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
VLSID
2002
IEEE
14 years 8 months ago
2002
IEEE
Power gating is emerging as a viable solution to reduction of leakage current. However, power gated circuits are different from the conventional designs in the sense that a power-...
GLVLSI
2010
IEEE
14 years 21 days ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
VLSID
2003
IEEE
14 years 8 months ago
2003
IEEE
In the previous work, the problem of nding gate delays to eliminate glitches has been solved by linear programs (LP) requiring an exponentially large number ofconstraints. By intr...