Assessing IC manufacturing process fluctuations and their impacts on IC interconnect performance has become unavoidable for modern DSM designs. However, the construction of parame...
Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, S...
—1 In this paper we present a stochastic model order reduction technique for interconnect extraction in the presence of process variabilities, i.e. variation-aware extraction. It...
In this paper, we propose a novel statistical model order reduction technique, called statistical spectrum model order reduction (SSMOR) method, which considers both intra-die and...
Jeffrey Fan, Ning Mi, Sheldon X.-D. Tan, Yici Cai,...
Skin effect makes interconnect resistance and inductance frequency dependent. This paper addresses the problem of efficiently estimating the signal characteristics of any RLC netw...
Abstract-- This paper describes the stochastic model order reduction algorithm via stochastic Hermite Polynomials from the practical implementation perspective. Comparing with exis...
Yi Zou, Yici Cai, Qiang Zhou, Xianlong Hong, Sheld...