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ISSS
2002
IEEE
14 years 2 months ago
2002
IEEE
Currently, since many SoCs include heterogeneous components such as CPUs, DSPs, ASICs, memories, buses, etc., system integration becomes a major step in the design flow. To enable...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
With the relentless scaling of semiconductor technology, the lifetime reliability of embedded multiprocessor platforms has become one of the major concerns for the industry. If th...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract--Leakage power consumption contributes significantly to the overall power dissipation for systems that are manufactured in advanced deep sub-micron technology. Different f...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
DATE
2010
IEEE
14 years 2 months ago
2010
IEEE
This paper addresses the problem of stochastic task execution time estimation agnostic to the process distributions. The proposed method is orthogonal to the application structure ...