—Time-Correlated Single Photon Counting and Burst Illumination Laser data can be used for range profiling and target classification. In general, the problem is to analyze the res...
Sergio Hernandez-Marin, Andrew M. Wallace, Gavin J...
— With process variation becoming a growing concern in deep submicron technologies, the ability to efficiently obtain an accurate estimate of failure probability of SRAM compone...
Abstract--More and more embedded systems provide a multitude of services, implemented by a large number of networked hardware components. In early design phases, dimensioning such ...
This paper investigates methods for clock skew minimization using buffer and wire sizing. First, a technique that significantly improves solution quality and stability of sequent...
Matthew R. Guthaus, Dennis Sylvester, Richard B. B...
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...