367 search results - page 4 / 74 » Multi-Core Design Automation Challenges |
DAC
2001
ACM
14 years 8 months ago
2001
ACM
We highlight several fundamental challenges to designing highperformance integrated circuits in nanometer-scale technologies (i.e. drawn feature sizes < 100 nm). Dynamic power ...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
Abstract— Physics offers several active devices with nanometerscale footprint, which can be best used in combination with a CMOS subsystem. Such hybrid circuits offer the potenti...
DAC
2000
ACM
14 years 8 months ago
2000
ACM
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
ASPDAC
2012
ACM
12 years 3 months ago
2012
ACM
Behavioral synthesis tools have made significant progress in compiling high-level programs into register-transfer level (RTL) specifications. But manually rewriting code is still ...