980 search results - page 30 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
144
Voted
ISQED
2010
IEEE
15 years 10 months ago
2010
IEEE
— This paper proposes a two-dimensional scan shift control concept for multiple scan chain design. Multiple scan chain test scheme provides very low scan power by skipping many l...
175
Voted
EVOW
2001
Springer
15 years 10 months ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
113
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper presents the impact of multiple-detect test patterns on outgoing product quality. It introduces an ATPG tool that generates multiple-detect test patterns while maximizi...
156
Voted
ICCAD
1997
IEEE
15 years 9 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
162
Voted
DATE
2000
IEEE
15 years 10 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...