51 search results - page 5 / 11 » On Programmable Memory Built-In Self Test Architectures |
MTDT
2000
IEEE
14 years 28 days ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
ISCAS
2005
IEEE
14 years 2 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
VLSID
2003
IEEE
14 years 9 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...