In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk...
This paper presents a new application field for the Goertzel algorithm. The test of mixed-signal circuits involves the generation and analysis of signals. A standard method for th...
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...