60 search results - page 6 / 12 » On Reducing Circuit Malfunctions Caused by Soft Errors |
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
—Power and energy consumption has emerged as the premier and most constraining aspect in modern computational systems. Dynamic Voltage Scheduling (DVS) has been provably one of t...
LCTRTS
2010
Springer
14 years 8 days ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
IOLTS
2008
IEEE
14 years 1 months ago
2008
IEEE
Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises s...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
Logic Soft Errors caused by radiation are a major concern when working with circuits that need to operate in harsh environments, such as space or avionics applications, where soft ...