38 search results - page 7 / 8 » On Reducing Test Data Volume and Test Application Time for M... |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
VMV
2001
13 years 9 months ago
2001
In many applications surfaces containing a large number of primitives occur. Geometry compression reduces storage space and transmission time for such models. A special case is gi...
ITC
1997
IEEE
13 years 11 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...