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» On Test Scheduling for Core-Based SOCs
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DAC
1998
ACM
14 years 8 months ago
Power Optimization of Variable Voltage Core-Based Systems
The growing class of portable systems, such as personal computing and communication devices, has resulted in a new set of system design requirements, mainly characterized by domin...
Inki Hong, Darko Kirovski, Gang Qu, Miodrag Potkon...
TCAD
2002
73views more  TCAD 2002»
13 years 7 months ago
System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...
Vikram Iyengar, Krishnendu Chakrabarty
DATE
2006
IEEE
134views Hardware» more  DATE 2006»
14 years 1 months ago
Power constrained and defect-probability driven SoC test scheduling with test set partitioning
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
Zhiyuan He, Zebo Peng, Petru Eles
DATE
2006
IEEE
98views Hardware» more  DATE 2006»
14 years 1 months ago
Power-constrained test scheduling for multi-clock domain SoCs
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that consists of cores with different clock frequencies during test. We also propose a t...
Tomokazu Yoneda, Kimihiko Masuda, Hideo Fujiwara
DATE
2003
IEEE
96views Hardware» more  DATE 2003»
14 years 28 days ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...