We present a hybrid BIST approach that extracts the most frequently occurring sequences from deterministic test patterns; these extracted sequences are stored on-chip. We use clus...
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple o...