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» On the Adders with Minimum Tests
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ICASSP
2008
IEEE
14 years 2 months ago
Minimum mean bayes risk error quantization of prior probabilities
Bayesian hypothesis testing is investigated when the prior probabilities of the hypotheses, taken as a random vector, must be quantized. Nearest neighbor and centroid conditions f...
Kush R. Varshney, Lav R. Varshney
ASAP
2007
IEEE
109views Hardware» more  ASAP 2007»
13 years 9 months ago
Long Live Small Fan-in Majority Gates Their Reign Looks Like Coming!
This paper explores the reliability of three different minimum fan-in majority gates full adder (FA) designs, and compares them to the performance of a standard XOR-based FA. The ...
Walid Ibrahim, Valeriu Beiu
DATE
1999
IEEE
102views Hardware» more  DATE 1999»
13 years 12 months ago
Minimal Length Diagnostic Tests for Analog Circuits using Test History
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
Alfred V. Gomes, Abhijit Chatterjee
IV
1999
IEEE
151views Visualization» more  IV 1999»
13 years 12 months ago
Occlusion Culling Using Minimum Occluder Set and Opacity Map
The aim of occlusion culling is to cull away a significant amount of invisible primitives at different viewpoints. We present two algorithms to improve occlusion culling for a hig...
Poon Chun Ho, Wenping Wang
ETS
2009
IEEE
99views Hardware» more  ETS 2009»
13 years 5 months ago
On Minimization of Peak Power for Scan Circuit during Test
Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, ...