1795 search results - page 121 / 359 » On the Complexity of Circuit Satisfiability |
DAC
2009
ACM
14 years 10 months ago
2009
ACM
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
DAC
2002
ACM
14 years 10 months ago
2002
ACM
A central problem in functional verification is to check that a circuit block is producing correct outputs while enforcing that the environment is providing legal inputs. To attac...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors i...
DAC
2006
ACM
14 years 9 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
ICCD
2007
IEEE
14 years 5 months ago
2007
IEEE
Building fully synchronous VLSI circuits is becoming less viable as circuit geometries evolve. However, before the adoption of purely asynchronous strategies in VLSI design, globa...