Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
A central problem in functional verification is to check that a circuit block is producing correct outputs while enforcing that the environment is providing legal inputs. To attac...
Subthreshold circuit designs have been demonstrated to be a successful alternative when ultra-low power consumption is paramount. However, the characteristics of MOS transistors i...
John Keane, Hanyong Eom, Tae-Hyoung Kim, Sachin S....
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
Building fully synchronous VLSI circuits is becoming less viable as circuit geometries evolve. However, before the adoption of purely asynchronous strategies in VLSI design, globa...
Julian J. H. Pontes, Rafael Soares, Ewerson Carval...