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» On the Complexity of Circuit Satisfiability
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DAC
2006
ACM
14 years 2 months ago
Design in reliability for communication designs
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
Uday Reddy Bandi, Murty Dasaka, Pavan K. Kumar
DAC
1998
ACM
14 years 10 months ago
Maximum Power Estimation Using the Limiting Distributions of Extreme Order Statistics
In this paper we present a statistical method for estimating the maximum power consumption in VLSI circuits. The method is based on the theory of extreme order statistics applied ...
Qinru Qiu, Qing Wu, Massoud Pedram
DAC
2003
ACM
14 years 10 months ago
Temporofunctional crosstalk noise analysis
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. This paper proposes a method of characterizing correlation of signal tra...
Donald Chai, Alex Kondratyev, Yajun Ran, Kenneth H...
VTS
1995
IEEE
100views Hardware» more  VTS 1995»
14 years 13 days ago
Transformed pseudo-random patterns for BIST
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...
Nur A. Touba, Edward J. McCluskey
CC
2006
Springer
108views System Software» more  CC 2006»
13 years 9 months ago
Languages to diagonalize against advice classes
Variants of Kannan's Theorem are given where the circuits of the original theorem are replaced by arbitrary recursively presentable classes of languages that use advice string...
Chris Pollett