372 search results - page 21 / 75 » On the Fault Testing for Reversible Circuits |
TODAES
1998
13 years 8 months ago
1998
DFT
2003
IEEE
14 years 1 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they only model a subset of delay defect behaviors. To solve this ...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
We discuss fault equivalence and dominance relations for multiple output combinational circuits. The conventional definition for equivalence says that “Two faults are equivalen...
DFT
2006
IEEE
13 years 10 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
FTCS
1993
13 years 10 months ago
1993
We present a new test response compression method called cumulative balance testing (CBT)that extends both balance testing and accumulatorcompression testing. CBT uses an accumulat...