372 search results - page 63 / 75 » On the Fault Testing for Reversible Circuits |
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
We tackle the problem of fault-free assumptions in current PLB and interconnect built-in-self-test (BIST) techniques for FPGAs. These assumptions were made in order to develop stro...
ISLPED
2007
ACM
13 years 9 months ago
2007
ACM
Negative bias temperature instability (NBTI) has become a dominant reliability concern for nanoscale PMOS transistors. In this paper, we propose variable-latency adder (VL-adder) ...
GLVLSI
2008
IEEE
14 years 1 months ago
2008
IEEE
Reliability has become a practical concern in today’s VLSI design with advanced technologies. In-situ sensors have been proposed for reliability monitoring to provide advance wa...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
ICCAD
1999
IEEE
13 years 11 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...