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» On the Fault Testing for Reversible Circuits
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FPGA
2010
ACM
191views FPGA» more  FPGA 2010»
14 years 1 months ago
Voter insertion algorithms for FPGA designs using triple modular redundancy
Triple Modular Redundancy (TMR) is a common reliability technique for mitigating single event upsets (SEUs) in FPGA designs operating in radiation environments. For FPGA systems t...
Jonathan M. Johnson, Michael J. Wirthlin
DATE
2008
IEEE
124views Hardware» more  DATE 2008»
14 years 1 months ago
Automated Testability Enhancements for Logic Brick Libraries
Circuit fabrics composed of highly regular structures, called logic bricks, have been described recently for improving yield. An automated logic brick design flow based on a SAT ...
Jason G. Brown, Brian Taylor, Ronald D. Blanton, L...
IOLTS
2008
IEEE
102views Hardware» more  IOLTS 2008»
14 years 1 months ago
Integrating Scan Design and Soft Error Correction in Low-Power Applications
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
Michael E. Imhof, Hans-Joachim Wunderlich, Christi...
DATE
2006
IEEE
96views Hardware» more  DATE 2006»
14 years 1 months ago
On the relation between simulation-based and SAT-based diagnosis
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
Görschwin Fey, Sean Safarpour, Andreas G. Ven...
ITC
2003
IEEE
149views Hardware» more  ITC 2003»
14 years 22 days ago
On Reducing Aliasing Effects and Improving Diagnosis of Logic BIST Failures
Diagnosing failing vectors in a Built-In Self Test (BIST) environment is a difficult task because of the highly compressed signature coming out of the Multiple Input Shift Regist...
Ramesh C. Tekumalla