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» Optimal Vector Selection for Low Power BIST
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VTS
1998
IEEE
124views Hardware» more  VTS 1998»
13 years 12 months ago
A Test Pattern Generation Methodology for Low-Power Consumption
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
ETS
2007
IEEE
128views Hardware» more  ETS 2007»
13 years 9 months ago
Selecting Power-Optimal SBST Routines for On-Line Processor Testing
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
Andreas Merentitis, Nektarios Kranitis, Antonis M....
ICCAD
1994
IEEE
90views Hardware» more  ICCAD 1994»
13 years 11 months ago
Algorithm selection: a quantitative computation-intensive optimization approach
Given a set of specifications for a targeted application, algorithm selection refers to choosing the most suitable algorithm for a given goal, among several functionally equivalen...
Miodrag Potkonjak, Jan M. Rabaey
ISLPED
2003
ACM
96views Hardware» more  ISLPED 2003»
14 years 27 days ago
Effective graph theoretic techniques for the generalized low power binding problem
This paper proposes two very fast graph theoretic heuristics for the low power binding problem given fixed number of resources and multiple architectures for the resources. First...
Azadeh Davoodi, Ankur Srivastava
EVOW
1999
Springer
13 years 12 months ago
Test Pattern Generation Under Low Power Constraints
A technique is proposed to reduce the peak power consumption of sequential circuits during test pattern application. High-speed computation intensive VLSI systems, as telecommunica...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...