1583 search results - page 309 / 317 » Parallel High-Order Integrators |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...
CAV
2010
Springer
13 years 11 months ago
2010
Springer
ions of ODE models (MAPLE, GNA). On the algorithmic side (Sec. 3.2), it supports two main streams in high-performance model checking: reachability analysis based on BDDs (symbolic)...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
We present a methodology for off-chip memory bandwidth minimization through application-driven L2 cache partitioning in multicore systems. A major challenge with multi-core system...
CASC
2006
Springer
13 years 11 months ago
2006
Springer
We address various aspects of our computer algebra-based computer logic system redlog. There are numerous examples in the literature for successful applications of redlog to practi...
DSN
2004
IEEE
13 years 11 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...