149 search results - page 5 / 30 » Parametric Fault Simulation and Test Vector Generation |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
DATE
2002
IEEE
14 years 9 days ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
ICCAD
2000
IEEE
13 years 11 months ago
2000
IEEE
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
DFT
2002
IEEE
14 years 9 days ago
2002
IEEE
GLVLSI
2009
IEEE
13 years 5 months ago
2009
IEEE
To assist in dynamic assertion-based verification, we present a method to automatically build a test vector generator from a temporal property. Based on the duality between monito...